General Purpose Electronic Test Equipment Parts

(Page 11) End item NSN parts page 11 of 45
Part Number
NSN
NIIN
1741A-H14 Oscilloscope
011021456
1742A-034 Oscilloscope
012052059
175-AV/53A/58 Multimeter
014439922
175AV/1758 Multimeter
013106232
176 Pulsed High Fixture
003974184
18-55200-170 Telecommunication Syste Test Set
013699813
1801A Electrical-electron Plug-in Unit
001356978
1801C Sweep Generator
012553183
1801F-020 Electrical-electron Plug-in Unit
002346117
1801F-021 Electrical-electron Plug-in Unit
002346117
1801F-OPT21 Electrical-electron Plug-in Unit
002346117
1801F20 Electrical-electron Plug-in Unit
002346117
1802A Electrical-electron Plug-in Unit
004647744
1803A Electrical-electron Plug-in Unit
008938745
1809A Electrical-electron Plug-in Unit
010178561
1821-021 Time Bas
004102406
1821F Time Bas
004102406
1821F-OPT21 Time Bas
004102406
1823 Electrical Frequency Meter
010702578
1825A Electrical-electron Plug-in Unit
000228244
Page: 11 ...

General Purpose Electronic Test Equipment

Picture of General Purpose Electronic Test Equipment

Electronic test equipment is used to create signals and capture responses from electronic devices under test (DUTs). In this way, the proper operation of the DUT can be proven or faults in the device can be traced. Use of electronic test equipment is essential to any serious work on electronics systems.

Practical electronics engineering and assembly requires the use of many different kinds of electronic test equipment ranging from the very simple and inexpensive (such as a test light consisting of just a light bulb and a test lead) to extremely complex and sophisticated such as automatic test equipment (ATE). ATE often includes many of these instruments in real and simulated forms.

Generally, more advanced test gear is necessary when developing circuits and systems than is needed when doing production testing or when troubleshooting existing production units in the field.

The addition of a high-speed switching system to a test system’s configuration allows for faster, more cost-effective testing of multiple devices, and is designed to reduce both test errors and costs. Designing a test system’s switching configuration requires an understanding of the signals to be switched and the tests to be performed, as well as the switching hardware form factors available.

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