General Purpose Electronic Test Equipment Parts

(Page 17) End item NSN parts page 17 of 45
Part Number
NSN
NIIN
2947 Radio Test Set
014326997
2982 Phase Angle Meter
011837444
29A50-20 Electrical Dummy Load
010827152
2G299DU Signal Generator
001506338
3000B Signal Generator
012352826
3015A-95 Voltmeter
011253581
301A Voltmeter
004702722
3028B MOD 164-VDP Multimeter
011372060
3028B MOD 172 Multimeter
012221543
3028BM0D163 Multimeter
010904458
3028BM0D164 Multimeter
010904459
302A Spectrum Analyzer
009584473
303-01 Voltmeter
010255984
303-09 Voltmeter
004246089
3031 Electrical Dummy Load
013763725
3036B MOD 968 Multimeter
011726097
303B Spectrum Analyzer
005758013
304DA01403 Signal Generator
012509594
304DA01458 Signal Generator
012731259
304H Oscilloscope
006431709
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General Purpose Electronic Test Equipment

Picture of General Purpose Electronic Test Equipment

Electronic test equipment is used to create signals and capture responses from electronic devices under test (DUTs). In this way, the proper operation of the DUT can be proven or faults in the device can be traced. Use of electronic test equipment is essential to any serious work on electronics systems.

Practical electronics engineering and assembly requires the use of many different kinds of electronic test equipment ranging from the very simple and inexpensive (such as a test light consisting of just a light bulb and a test lead) to extremely complex and sophisticated such as automatic test equipment (ATE). ATE often includes many of these instruments in real and simulated forms.

Generally, more advanced test gear is necessary when developing circuits and systems than is needed when doing production testing or when troubleshooting existing production units in the field.

The addition of a high-speed switching system to a test system’s configuration allows for faster, more cost-effective testing of multiple devices, and is designed to reduce both test errors and costs. Designing a test system’s switching configuration requires an understanding of the signals to be switched and the tests to be performed, as well as the switching hardware form factors available.

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