General Purpose Electronic Test Equipment Parts

(Page 19) End item NSN parts page 19 of 45
Part Number
NSN
NIIN
330B Spectrum Analyzer
006689418
3310A Function Generator
004660586
3312A Electronic Te Function Generator
010284989
331A Spectrum Analyzer
009137711
3324A-001-002 Electronic Te Function Generator
013658254
3324A-001-002-908-H02 Electronic Te Function Generator
013658254
3325A Electronic Te Function Generator
011078152
3325A-001 Electronic Te Function Generator
011768594
3325B-001-002 Electronic Te Function Generator
012979968
332A Distortion Analyzer
009363135
332B Voltage Standard
002398924
333A Spectrum Analyzer
000894227
334A Spectrum Analyzer
008718012
335 Variable Electronic Filter
000012376
3406A Broad Band Test Set
001133491
340B Audio Level Meter
007931343
342C554H02 Electrical Dummy Load
007849045
343D-1202.5 Power Supply
013133758
34401A-102 Multimeter
013758765
34401A-H01 Multimeter
013758765
Page: 19 ...

General Purpose Electronic Test Equipment

Picture of General Purpose Electronic Test Equipment

Electronic test equipment is used to create signals and capture responses from electronic devices under test (DUTs). In this way, the proper operation of the DUT can be proven or faults in the device can be traced. Use of electronic test equipment is essential to any serious work on electronics systems.

Practical electronics engineering and assembly requires the use of many different kinds of electronic test equipment ranging from the very simple and inexpensive (such as a test light consisting of just a light bulb and a test lead) to extremely complex and sophisticated such as automatic test equipment (ATE). ATE often includes many of these instruments in real and simulated forms.

Generally, more advanced test gear is necessary when developing circuits and systems than is needed when doing production testing or when troubleshooting existing production units in the field.

The addition of a high-speed switching system to a test system’s configuration allows for faster, more cost-effective testing of multiple devices, and is designed to reduce both test errors and costs. Designing a test system’s switching configuration requires an understanding of the signals to be switched and the tests to be performed, as well as the switching hardware form factors available.

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