General Purpose Electronic Test Equipment Parts

(Page 24) End item NSN parts page 24 of 45
Part Number
NSN
NIIN
402-0437 Oscillograph
002023118
402-9616 Electrical-electron Plug-in Unit
010188548
402-9721 Spectrum Analyzer
013407933
402-9728 Test Lead
003851156
4025 Power Supply
012268886
403A Voltmeter
009966340
405-0744 Electrical Power Calibrator
014151698
405-3966 Signal Generator
013675551
405-4491 Decade Resistor
005853152
405-4505 Phase Gain Indicator
001932224
405-4511 Standing Wave Ratio Meter
000668519
410-0881 Oscilloscope
010326914
410-1440 Electronic Te Function Generator
010284989
410-1651 Electrical-electron Plug-in Unit
005302635
410-1700 Digital Circuit Test Kit
003851154
410-1746 Oscilloscope
009570509
410-7797 Multimeter
013122930
410-7981 Oscilloscope
013041744
410B Multimeter
003602493
411A Multimeter
000668520
Page: 24 ...

General Purpose Electronic Test Equipment

Picture of General Purpose Electronic Test Equipment

Electronic test equipment is used to create signals and capture responses from electronic devices under test (DUTs). In this way, the proper operation of the DUT can be proven or faults in the device can be traced. Use of electronic test equipment is essential to any serious work on electronics systems.

Practical electronics engineering and assembly requires the use of many different kinds of electronic test equipment ranging from the very simple and inexpensive (such as a test light consisting of just a light bulb and a test lead) to extremely complex and sophisticated such as automatic test equipment (ATE). ATE often includes many of these instruments in real and simulated forms.

Generally, more advanced test gear is necessary when developing circuits and systems than is needed when doing production testing or when troubleshooting existing production units in the field.

The addition of a high-speed switching system to a test system’s configuration allows for faster, more cost-effective testing of multiple devices, and is designed to reduce both test errors and costs. Designing a test system’s switching configuration requires an understanding of the signals to be switched and the tests to be performed, as well as the switching hardware form factors available.

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