General Purpose Electronic Test Equipment Parts

(Page 25) End item NSN parts page 25 of 45
Part Number
NSN
NIIN
411AW-11027A Rf Millivoltmeter
002250239
412A Multimeter
010904458
413-0032 Spectrum Analyzer
001854802
413-0034 Signal Generator
008574352
413-0310 Electrical-electron Plug-in Unit
004780597
413-0345 Analyzer
011287868
413-0353 Electrical-electron Plug-in Unit
001932181
413-0355 Broad Band Test Set
001133491
413-0356 Voltmeter
004223241
413-1033 Pulse Generator
010774947
413-1164 Decade Resistor
001237458
413-1429 Signal Generator
012583140
413-1483 Signal Generator
004893732
413-1619 Signal Generator
012522368
413-1800 Voltmeter
000378564
413-2161 Radio Frequency Plu
010508799
413-2573 Radio Frequency Power Divider
011089833
413-2968 Null Meter
002263718
413-2995 Audio Level Meter
007931343
413-3498 Voltage Calibrator
010636325
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General Purpose Electronic Test Equipment

Picture of General Purpose Electronic Test Equipment

Electronic test equipment is used to create signals and capture responses from electronic devices under test (DUTs). In this way, the proper operation of the DUT can be proven or faults in the device can be traced. Use of electronic test equipment is essential to any serious work on electronics systems.

Practical electronics engineering and assembly requires the use of many different kinds of electronic test equipment ranging from the very simple and inexpensive (such as a test light consisting of just a light bulb and a test lead) to extremely complex and sophisticated such as automatic test equipment (ATE). ATE often includes many of these instruments in real and simulated forms.

Generally, more advanced test gear is necessary when developing circuits and systems than is needed when doing production testing or when troubleshooting existing production units in the field.

The addition of a high-speed switching system to a test system’s configuration allows for faster, more cost-effective testing of multiple devices, and is designed to reduce both test errors and costs. Designing a test system’s switching configuration requires an understanding of the signals to be switched and the tests to be performed, as well as the switching hardware form factors available.

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