General Purpose Electronic Test Equipment Parts

(Page 28) End item NSN parts page 28 of 45
Part Number
NSN
NIIN
4284A Electrical Frequency Meter
013867510
428A Ammeter
007980659
42B Radio Frequency Power Test Set
003959430
430-8285 Digital Reado Electronic Counter
010491844
4310AK-16P Generator Sweeper
010407279
432A-E41 Radio Frequency Power Test Set
011453026
432A-E42 Special Scale Meter
011327800
435B-001-009-8484A Power Factor Meter
011267272
435B-001-009-8484ATE Power Factor Meter
011267272
435B-E12 Power Factor Meter
011267272
435B-E19 Power Factor Meter
011543789
436A Radio Frequency Head Plug-in
010411589
436A-004-022-8481A-8481B-11730B Radio Frequency Power Meter
012521844
436A-004-022/8481A/8481B/11730B Radio Frequency Power Meter
012521844
436A-E90 Digital Power Meter
012493351
4381 Radio Frequency Power Test Set
010972246
4381-230 Radio Frequency Power Test Set
010972246
4398-M Ohmmeter
012493364
4410-025 Wattmeter
011999387
4410A-025 Wattmeter
011999387
Page: 28 ...

General Purpose Electronic Test Equipment

Picture of General Purpose Electronic Test Equipment

Electronic test equipment is used to create signals and capture responses from electronic devices under test (DUTs). In this way, the proper operation of the DUT can be proven or faults in the device can be traced. Use of electronic test equipment is essential to any serious work on electronics systems.

Practical electronics engineering and assembly requires the use of many different kinds of electronic test equipment ranging from the very simple and inexpensive (such as a test light consisting of just a light bulb and a test lead) to extremely complex and sophisticated such as automatic test equipment (ATE). ATE often includes many of these instruments in real and simulated forms.

Generally, more advanced test gear is necessary when developing circuits and systems than is needed when doing production testing or when troubleshooting existing production units in the field.

The addition of a high-speed switching system to a test system’s configuration allows for faster, more cost-effective testing of multiple devices, and is designed to reduce both test errors and costs. Designing a test system’s switching configuration requires an understanding of the signals to be switched and the tests to be performed, as well as the switching hardware form factors available.

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