General Purpose Electronic Test Equipment Parts

(Page 30) End item NSN parts page 30 of 45
Part Number
NSN
NIIN
492-02-08 Spectrum Analyzer
011663875
492-08 Spectrum Analyzer
011638749
4920M Voltage Standard
013632552
492AP-06 Spectrum Analyzer
012340485
495A Radio Frequency Amplifier
000841106
495P-39/TR503/TM5003 Spectrum Analyzer
013129513
498709 Test Lead
010165991
499-6877804 Fiber Optic Cable Assembly
014186285
49990 28002 Special Scale Meter
010799347
4EB21 Multimeter
015217106
5001/80 Multimeter
012038051
5004A-220 Electronic Digital Data Analyzer
011490280
5004A0PT220 Electronic Digital Data Analyzer
011490280
5006A Electronic Digital Data Analyzer
011490280
5015MS Multimeter
010904458
5015T Digital Circuit Test Kit
003851154
502-120-G4 Radio Frequency Power Test Set
011368593
5061A-003-908 Cesium Standard
012597354
5100 Frost Poi Indicator
012419977
5100-G501 Frost Poi Indicator
012419977
Page: 30 ...

General Purpose Electronic Test Equipment

Picture of General Purpose Electronic Test Equipment

Electronic test equipment is used to create signals and capture responses from electronic devices under test (DUTs). In this way, the proper operation of the DUT can be proven or faults in the device can be traced. Use of electronic test equipment is essential to any serious work on electronics systems.

Practical electronics engineering and assembly requires the use of many different kinds of electronic test equipment ranging from the very simple and inexpensive (such as a test light consisting of just a light bulb and a test lead) to extremely complex and sophisticated such as automatic test equipment (ATE). ATE often includes many of these instruments in real and simulated forms.

Generally, more advanced test gear is necessary when developing circuits and systems than is needed when doing production testing or when troubleshooting existing production units in the field.

The addition of a high-speed switching system to a test system’s configuration allows for faster, more cost-effective testing of multiple devices, and is designed to reduce both test errors and costs. Designing a test system’s switching configuration requires an understanding of the signals to be switched and the tests to be performed, as well as the switching hardware form factors available.

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