General Purpose Electronic Test Equipment Parts

(Page 32) End item NSN parts page 32 of 45
Part Number
NSN
NIIN
5245L-H61 Electrical Frequency Meter
001798981
524B Electrical Frequency Meter
005398868
5250 Moisture Content Indicator
013203344
5250-G501 Moisture Content Indicator
013203344
5253B Electrical-electron Plug-in Unit
002263483
5253B Frequency Counter
009066729
5253B-H13 Electrical-electron Plug-in Unit
002263483
5256A Electrical-electron Plug-in Unit
001034895
5257A Electrical-electron Plug-in Unit
001300014
5262A Electrical-electron Plug-in Unit
009670460
5265A Voltmeter
009570511
528-1 Waveform Monitor
010429758
528A OPT 1 Waveform Monitor
010429758
53-54B Electrical-electron Plug-in Unit
007160883
530-20 Synchro Test Set
005253241
530-20S1634 Synchro Test Set
005253241
5300 Resistance Bridge
001660398
5300S1 Resistance Bridge
001660398
5300TYPES Resistance Bridge
001660398
5321 Multimeter
002989638
Page: 32 ...

General Purpose Electronic Test Equipment

Picture of General Purpose Electronic Test Equipment

Electronic test equipment is used to create signals and capture responses from electronic devices under test (DUTs). In this way, the proper operation of the DUT can be proven or faults in the device can be traced. Use of electronic test equipment is essential to any serious work on electronics systems.

Practical electronics engineering and assembly requires the use of many different kinds of electronic test equipment ranging from the very simple and inexpensive (such as a test light consisting of just a light bulb and a test lead) to extremely complex and sophisticated such as automatic test equipment (ATE). ATE often includes many of these instruments in real and simulated forms.

Generally, more advanced test gear is necessary when developing circuits and systems than is needed when doing production testing or when troubleshooting existing production units in the field.

The addition of a high-speed switching system to a test system’s configuration allows for faster, more cost-effective testing of multiple devices, and is designed to reduce both test errors and costs. Designing a test system’s switching configuration requires an understanding of the signals to be switched and the tests to be performed, as well as the switching hardware form factors available.

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