General Purpose Electronic Test Equipment Parts

(Page 34) End item NSN parts page 34 of 45
Part Number
NSN
NIIN
5345A Digital Reado Electronic Counter
005314752
5345A-011-5355A-5356C Digital Reado Electronic Counter
011968342
5345A-011/5355A/5356C Digital Reado Electronic Counter
011968342
5350B-001 Digital Reado Electronic Counter
012756268
5350B-001-H03 Digital Reado Electronic Counter
012519860
5351B-001 Digital Reado Electronic Counter
013480115
5351BOPT001 Digital Reado Electronic Counter
013480115
5352B-001 Digital Reado Electronic Counter
012509635
5352B-001-910 Digital Reado Electronic Counter
012509635
5352B-001-H03 Digital Reado Electronic Counter
012509635
5352B-001/910 Digital Reado Electronic Counter
012509635
5355A Electrical-electron Plug-in Unit
011111074
5370B Digital Reado Electronic Counter
011653153
537A Electrical Frequency Meter
009309687
539B Electron Tube Test Set
005530248
540-20 Resolver-syn Bridge
010328493
540B Voltage Calibrator
002880184
545-W10 Digital Reado Electronic Counter
011225602
54501A-E01-910 Oscilloscope
013075544
54501A-E01/910 Oscilloscope
013075544
Page: 34 ...

General Purpose Electronic Test Equipment

Picture of General Purpose Electronic Test Equipment

Electronic test equipment is used to create signals and capture responses from electronic devices under test (DUTs). In this way, the proper operation of the DUT can be proven or faults in the device can be traced. Use of electronic test equipment is essential to any serious work on electronics systems.

Practical electronics engineering and assembly requires the use of many different kinds of electronic test equipment ranging from the very simple and inexpensive (such as a test light consisting of just a light bulb and a test lead) to extremely complex and sophisticated such as automatic test equipment (ATE). ATE often includes many of these instruments in real and simulated forms.

Generally, more advanced test gear is necessary when developing circuits and systems than is needed when doing production testing or when troubleshooting existing production units in the field.

The addition of a high-speed switching system to a test system’s configuration allows for faster, more cost-effective testing of multiple devices, and is designed to reduce both test errors and costs. Designing a test system’s switching configuration requires an understanding of the signals to be switched and the tests to be performed, as well as the switching hardware form factors available.

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