Teilenummer 3490-A

Semiconductor Device Test Set

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Teilenummer
Entmilitarisierung
Lagerfähigkeit
UOM
NIIN
Teilenummer:
3490-a
Entmilitarisierung:
No
Lagerfähigkeit:
N/A
Maßeinheit:
1 EA
NIIN:
010447748

Informationen zum Teil
Mfg name-transistor analyzer

NSN
Nationale Bestandsnummer:
6625-01-044-7748 6625010447748
TXT
Beschreibung:
Semiconductor Device Test Set
INC
INC
Artikelname-Code:
25006
MRC:
A measurement taken at right angles to the length of an item,in distinction from thickness.ABGL
Width:
19.000 inches
MRC:
The value,or range of values,of root mean square potential for which the item is rated.ACYN
Ac Voltage Rating:
110.0 volts
MRC:
The number of complete cyclic changes,per unit of time,for which an item is rated.ACZB
Frequency Rating:
60.0 hertz
MRC:
A linear measurement from the surface to a specified inner point on an item,in distinction from height.AEJZ
Depth:
15.000 inches
MRC:
The relationship of the electrical power source to the item.AKWC
Electrical Power Source Relationship:
Operating
MRC:
An indication of the feature/s/ of the inclosure.ANPZ
Inclosure Feature:
Single item w/carrying case
MRC:
Indicates the type of test for which the item is designed.AQXY
Test Type For Which Designed:
Power and signal
MRC:
The number of alternating current phases.FAAZ
Phase:
Single
MRC:
Describes the capabilities,intended use,and/or purpose for which the item is provided.FTLD
Functional Description:
Allows plotting of transistor characteristic curves; any type of transistor test
MRC:
A measurement from the bottom to the top of an object,in distinction from depth.HGTH
Height:
8.000 inches
MRC:
Characteristics or qualities of an item,not covered in any other requirement,which are considered essential information for one or more functions excluding nsn assignment.SUPP
Supplementary Features:
Portable; leakage read down to 100 nanoamperes; continuous current

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