Teilenummer 370

Semiconductor Device Test Set

Preise und Verfügbarkeit

Reichen Sie dieses Formular ein, um die aktuellen Preise und die Verfügbarkeit dieser NSN zu erfahren.
Teilenummer:
Menge:
E-Mail-Adresse:
Telefon:
Referenz:
Firma:
Name:

Wir geben Ihre Daten nicht an Dritte weiter und verkaufen sie auch nicht.
Privatsphäre | Bedingungen

All major credit cards accepted as well as gov. p-cards
Teilenummer
Entmilitarisierung
Lagerfähigkeit
UOM
NIIN
Teilenummer:
370
Entmilitarisierung:
No
Lagerfähigkeit:
Maßeinheit:
NIIN:
012587065

Informationen zum Teil
7 inch diag crt; 16v, 80v, 400v, 2000v ranges

NSN
Nationale Bestandsnummer:
6625-01-258-7065 6625012587065
TXT
Beschreibung:
Semiconductor Device Test Set
INC
INC
Artikelname-Code:
25006
MRC:
A measurement taken at right angles to the length of an item,in distinction from thickness.ABGL
Width:
16.900 inches
MRC:
The value,or range of values,of root mean square potential for which the item is rated.ACYN
Ac Voltage Rating:
115.0 volts
MRC:
The number of complete cyclic changes,per unit of time,for which an item is rated.ACZB
Frequency Rating:
60.0 hertz
MRC:
A linear measurement from the surface to a specified inner point on an item,in distinction from height.AEJZ
Depth:
25.100 inches
MRC:
The relationship of the electrical power source to the item.AKWC
Electrical Power Source Relationship:
Operating
MRC:
An indication of the feature/s/ of the inclosure.ANPZ
Inclosure Feature:
Single item w/housing
MRC:
Indicates the type of test for which the item is designed.AQXY
Test Type For Which Designed:
Electrostatic discharge of electrical overstress of integrated circuits
MRC:
The number of alternating current phases.FAAZ
Phase:
Single
MRC:
A measurement from the bottom to the top of an object,in distinction from depth.HGTH
Height:
13.100 inches
MRC:
Consists of plating,dip,and/or coating that cannot be wiped off.plating and/or coating is any chemical and/or metallic additive,electrochemical,or mild mechanical process which protects a surface.SURF
Surface Treatment:
Any acceptable

Ähnlich Semiconductor Device Test Sets

« Electrical and Electronic Properties Measuring and Testing Instruments {lang[catalog]}
Jetzt vergleichen»
Klar | Verstecken