Teilenummer 870

Semiconductor Device Test Set

Preise und Verfügbarkeit

Reichen Sie dieses Formular ein, um die aktuellen Preise und die Verfügbarkeit dieser NSN zu erfahren.
Teilenummer:
Menge:
E-Mail-Adresse:
Telefon:
Referenz:
Firma:
Name:

Wir geben Ihre Daten nicht an Dritte weiter und verkaufen sie auch nicht.
Privatsphäre | Bedingungen

All major credit cards accepted as well as gov. p-cards

Historische Preise für dieses Produkt liegen zwischen 869.28 and 1173.528 USD. Abhängig von Menge, Verfügbarkeit, Zustand, Lieferzeit und möglicher Einstellung eines Artikels können wir die Preise erst garantieren, wenn wir Ihnen ein aktuelles Angebot unterbreiten.

Teilenummer
Entmilitarisierung
Lagerfähigkeit
UOM
NIIN
Teilenummer:
870
Entmilitarisierung:
No
Lagerfähigkeit:
N/A
Maßeinheit:
1 EA
NIIN:
000813672
NSN
Nationale Bestandsnummer:
6625-00-081-3672 6625000813672
TXT
Beschreibung:
Semiconductor Device Test Set
INC
INC
Artikelname-Code:
25006
MRC:
A measurement taken at right angles to the length of an item,in distinction from thickness.ABGL
Width:
11.700 inches
MRC:
A measurement of the longest dimension of any object,in distinction from width.ABRY
Length:
14.500 inches
MRC:
The value,or range of values,of root mean square potential for which the item is rated.ACYN
Ac Voltage Rating:
115.0 volts
MRC:
The value,or range of values,of direct current potential for which the item is rated.ACYR
Dc Voltage Rating:
6.0 volts
MRC:
The value,or range of values,of direct current potential for which the item is rated.ACYR
Dc Voltage Rating:
Unable to decode
MRC:
The number of complete cyclic changes,per unit of time,for which an item is rated.ACZB
Frequency Rating:
60.0 hertz
MRC:
The number of complete cyclic changes,per unit of time,for which an item is rated.ACZB
Frequency Rating:
Unable to decode
MRC:
An indication of whether or not a facility/ies/ to accommodate a battery/ies/ is included.ALSF
Internal Battery Accommodation:
Included
MRC:
The element,compound,or mixture of which the item is fabricated,excluding any surface treatment,and its location.ANNQ
Material And Location:
Aluminum carrying case
MRC:
An indication of the feature/s/ of the inclosure.ANPZ
Inclosure Feature:
Single item w/carrying case
MRC:
Indicates the type of test for which the item is designed.AQXY
Test Type For Which Designed:
Measurement of voltage and current
MRC:
The number of alternating current phases.FAAZ
Phase:
Single
MRC:
A measurement from the bottom to the top of an object,in distinction from depth.HGTH
Height:
7.870 inches
MRC:
The justification for the assignment of a federal supply class /fsc/ to an item based on the classification of the next higher classifiable assembly.ZZZV
Fsc Application Data:
Test set, transistor, except specially designed

Ähnlich Semiconductor Device Test Sets

« Electrical and Electronic Properties Measuring and Testing Instruments {lang[catalog]}
Jetzt vergleichen»
Klar | Verstecken