Teilenummer BUC61001

Radar Test Set

Preise und Verfügbarkeit

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Teilenummer
Entmilitarisierung
Lagerfähigkeit
UOM
NIIN
Teilenummer:
buc61001
Entmilitarisierung:
Yes - DEMIL/MLI
Lagerfähigkeit:
Maßeinheit:
NIIN:
002099697
NSN
Nationale Bestandsnummer:
6625-00-209-9697 6625002099697
TXT
Beschreibung:
Radar Test Set
INC
INC
Artikelname-Code:
03661
INC
COM
Beachtung:
MRC:
The value,or range of values,of root mean square potential for which the item is rated.ACYN
Ac Voltage Rating:
Between 95.0 volts and 135.0 volts
MRC:
The number of complete cyclic changes,per unit of time,for which an item is rated.ACZB
Frequency Rating:
60.0 hertz
MRC:
The principal parts that are included in an assembled unit.AEAS
Major Components:
Power regulator assembly 1; control panel 250; control assembly 1
MRC:
The national stock number or the identification information of the end equipment for which the item is a part.AGAV
End Application:
5895-00-905-5919
MRC:
The name assigned to the item by the joint electronics type designation system.AKWA
Joint Electronics Type Designation System Item Name:
Test set, control memory assembly
MRC:
The type number assigned to the item by the joint electronics type designation system.AKWB
Joint Electronics Type Designation System Item Type Number:
An/gsm-11 ()
MRC:
The relationship of the electrical power source to the item.AKWC
Electrical Power Source Relationship:
Operating
MRC:
An indication of whether or not a facility/ies/ to accommodate a battery/ies/ is included.ALSF
Internal Battery Accommodation:
Not included
MRC:
An indication of the feature/s/ of the inclosure.ANPZ
Inclosure Feature:
Multiple item w/o carrying case
MRC:
An indication of the feature/s/ of the inclosure.ANPZ
Inclosure Feature:
Multiple item w/out carrying case
MRC:
Indicates the type of test for which the item is designed.AQXY
Test Type For Which Designed:
Tests the 512 & 4096 word, random access, linear select, ferrite core memories utilized in the jetds an/gsa-51 system; contains the control logic, power supplies & error detection circuits to permit exercising, testing & error comparison of core memory assemblys

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