Teilenummer
Entmilitarisierung
Lagerfähigkeit
UOM
NIIN
Entmilitarisierung:
Yes - DEMIL/MLI
NSN
Nationale Bestandsnummer:
TXT
Beschreibung:
Semiconductor Device Test Set
MRC:
A measurement taken at right angles to the length of an item,in distinction from thickness.ABGL
Width:
111.500 inches
MRC:
A measurement of the longest dimension of any object,in distinction from width.ABRY
Length:
8.000 inches
MRC:
The value,or range of values,of root mean square potential for which the item is rated.ACYN
Ac Voltage Rating:
Between 105.0 volts and 125.0 volts
MRC:
The number of complete cyclic changes,per unit of time,for which an item is rated.ACZB
Frequency Rating:
Between 50.0 hertz and 60.0 hertz
MRC:
An indication of whether or not a facility/ies/ to accommodate a battery/ies/ is included.ALSF
Internal Battery Accommodation:
Not included
MRC:
The element,compound,or mixture of which the item is fabricated,excluding any surface treatment,and its location.ANNQ
Material And Location:
Steel housing
MRC:
An indication of the feature/s/ of the inclosure.ANPZ
Inclosure Feature:
Single item w/housing
MRC:
Indicates the type of test for which the item is designed.AQXY
Test Type For Which Designed:
Measurement of static characteristics of medium and lower power diodes
MRC:
The testing functions such as range,sensitivity,output,and the like,for which the item is designed.AQXZ
Operating Test Capability:
Forward voltage 0 to 20v forward current 0 to 500 ma reverse voltage 0 to 300v reverse current 0 to 5ma
MRC:
The number of alternating current phases.FAAZ
Phase:
Single
MRC:
A measurement from the bottom to the top of an object,in distinction from depth.HGTH
Height:
9.250 inches
MRC:
The justification for the assignment of a federal supply class /fsc/ to an item based on the classification of the next higher classifiable assembly.ZZZV
Fsc Application Data:
Diode semiconductor devices test sets, except specially designed
