Teilenummer MIL-HDBK-300ATS

Semiconductor Device Test Set

Preise und Verfügbarkeit

Reichen Sie dieses Formular ein, um die aktuellen Preise und die Verfügbarkeit dieser NSN zu erfahren.
Teilenummer:
Menge:
E-Mail-Adresse:
Telefon:
Referenz:
Firma:
Name:

Wir geben Ihre Daten nicht an Dritte weiter und verkaufen sie auch nicht.
Privatsphäre | Bedingungen

All major credit cards accepted as well as gov. p-cards

Historische Preise für dieses Produkt liegen zwischen 4550 and 5950 USD. Abhängig von Menge, Verfügbarkeit, Zustand, Lieferzeit und möglicher Einstellung eines Artikels können wir die Preise erst garantieren, wenn wir Ihnen ein aktuelles Angebot unterbreiten.

Teilenummer
Entmilitarisierung
Lagerfähigkeit
UOM
NIIN
Teilenummer:
mil-hdbk-300ats
Entmilitarisierung:
Yes - DEMIL/MLI
Lagerfähigkeit:
N/A
Maßeinheit:
1 EA
NIIN:
015777189

Informationen zum Teil
Test set, semiconductor

NSN
Nationale Bestandsnummer:
6625-01-577-7189 6625015777189
TXT
Beschreibung:
Semiconductor Device Test Set
INC
INC
Artikelname-Code:
25006
INC
COM
Beachtung:
* ITAR Controlled
MRC:
The value,or range of values,of root mean square potential for which the item is rated.ACYN
Ac Voltage Rating:
110.0 volts or 240.0 volts
MRC:
The number of complete cyclic changes,per unit of time,for which an item is rated.ACZB
Frequency Rating:
Between 50.0 hertz and 400.0 hertz
MRC:
The principal parts that are included in an assembled unit.AEAS
Major Components:
Test set; pair microprobes; common test leads; shrouded test lead; power cord; cd manual
MRC:
The number of parts supplied with the item which may be required for application.AFHS
Accessory Component Quantity:
5
MRC:
The relationship of the electrical power source to the item.AKWC
Electrical Power Source Relationship:
Operating
MRC:
An indication of whether or not a facility/ies/ to accommodate a battery/ies/ is included.ALSF
Internal Battery Accommodation:
Not included
MRC:
An indication of the feature/s/ of the inclosure.ANPZ
Inclosure Feature:
Single item w/housing
MRC:
Indicates the type of test for which the item is designed.AQXY
Test Type For Which Designed:
In-circuit electronic component testing
MRC:
The number of alternating current phases.FAAZ
Phase:
Single
MRC:
The alpha-numeric designation that identifies the classification of the item according to the category of functions performed.FCLS
Functional Classification:
Aa-9.6
MRC:
Those unusual or unique characteristics or qualities of an item not covered in the other requirements and which are determined to be essential for identification.FEAT
Special Features:
Meets mil-prf-28800 class 3
MRC:
Describes the capabilities,intended use,and/or purpose for which the item is provided.FTLD
Functional Description:
Used to in-circuit test semiconductor components
MRC:
Indicates the date the item was entered into mil-hdbk-300.NTRD
Entry Date:
09-09-08
MRC:
The controlling activity and identification of a document used in lieu of a specification in the procurement of an item of supply.ZZZP
Purchase Description Identification:
98752-pd09wrgbec24

Ähnlich Semiconductor Device Test Sets

« Electrical and Electronic Properties Measuring and Testing Instruments {lang[catalog]}
Jetzt vergleichen»
Klar | Verstecken