Teilenummer MIL-HDBK-300PME

Semiconductor Device Test Set

Preise und Verfügbarkeit

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Teilenummer:
Menge:
E-Mail-Adresse:
Telefon:
Referenz:
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Historische Preise für dieses Produkt liegen zwischen 4283.5 and 5601.5 USD. Abhängig von Menge, Verfügbarkeit, Zustand, Lieferzeit und möglicher Einstellung eines Artikels können wir die Preise erst garantieren, wenn wir Ihnen ein aktuelles Angebot unterbreiten.

Teilenummer
Entmilitarisierung
Lagerfähigkeit
UOM
NIIN
Teilenummer:
mil-hdbk-300pme
Entmilitarisierung:
Yes - DEMIL/MLI
Lagerfähigkeit:
N/A
Maßeinheit:
1 EA
NIIN:
015814169
NSN
Nationale Bestandsnummer:
6625-01-581-4169 6625015814169
TXT
Beschreibung:
Semiconductor Device Test Set
INC
INC
Artikelname-Code:
25006
INC
COM
Beachtung:
MRC:
A measurement taken at right angles to the length of an item,in distinction from thickness.ABGL
Width:
11.100 inches
MRC:
The value,or range of values,of root mean square potential for which the item is rated.ACYN
Ac Voltage Rating:
100.0 volts or 115.0 volts or 230.0 volts
MRC:
The number of complete cyclic changes,per unit of time,for which an item is rated.ACZB
Frequency Rating:
Between 50.0 hertz and 60.0 hertz
MRC:
A linear measurement from the surface to a specified inner point on an item,in distinction from height.AEJZ
Depth:
8.500 inches
MRC:
The relationship of the electrical power source to the item.AKWC
Electrical Power Source Relationship:
Operating
MRC:
An indication of the feature/s/ of the inclosure.ANPZ
Inclosure Feature:
Single item w/housing
MRC:
Indicates the type of test for which the item is designed.AQXY
Test Type For Which Designed:
Resistance, capacitance, inductance
MRC:
The testing functions such as range,sensitivity,output,and the like,for which the item is designed.AQXZ
Operating Test Capability:
Frequencies 20, 50, 60, 200, 500, and 2khz; voltages 200milli, 3, 5, 10, 15, and 20v; resistance 10, 50, 100, 500, 1k, 5k, 10k, 50k, 100k ohms
MRC:
The number of alternating current phases.FAAZ
Phase:
Single
MRC:
The alpha-numeric designation that identifies the classification of the item according to the category of functions performed.FCLS
Functional Classification:
Aa-1.3
MRC:
Describes the capabilities,intended use,and/or purpose for which the item is provided.FTLD
Functional Description:
Used to test passive devices, diodes, transistors, gated devices, optoelectronic devices, and integrated circuits
MRC:
A measurement from the bottom to the top of an object,in distinction from depth.HGTH
Height:
4.400 inches
MRC:
Indicates the date the item was entered into mil-hdbk-300.NTRD
Entry Date:
10-01-14
MRC:
Indicates the relationship,such as construction,capabilities,and the like,of the item to a similar item.RTSE
Relationship To Similar Equipment:
Tracker 2800s can scan multi-pin

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