Teilenummer PL5010

Semiconductor Device Test Set

Preise und Verfügbarkeit

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Teilenummer
Entmilitarisierung
Lagerfähigkeit
UOM
NIIN
Teilenummer:
pl5010
Entmilitarisierung:
No
Lagerfähigkeit:
N/A
Maßeinheit:
1 EA
NIIN:
013623839

Informationen zum Teil
Tests most types of ttl and cmos digital ics; accessories supplies are instruction manual, ic library list, ak-5010 user library software and hardware, power cord, in-circuit ic test clip and cable for 14, 16, 20, 24, and 28-pin ic's, eeprom for learned test routines, ground cable, spare fuse

NSN
Nationale Bestandsnummer:
6625-01-362-3839 6625013623839
TXT
Beschreibung:
Semiconductor Device Test Set
INC
INC
Artikelname-Code:
25006
MRC:
A measurement taken at right angles to the length of an item,in distinction from thickness.ABGL
Width:
12.500 inches
MRC:
A measurement of the longest dimension of any object,in distinction from width.ABRY
Length:
17.000 inches
MRC:
The value,or range of values,of root mean square potential for which the item is rated.ACYN
Ac Voltage Rating:
100.0 volts or 120.0 volts or 200.0 volts or 240.0 volts
MRC:
The number of complete cyclic changes,per unit of time,for which an item is rated.ACZB
Frequency Rating:
Between 50.0 hertz and 60.0 hertz
MRC:
The relationship of the electrical power source to the item.AKWC
Electrical Power Source Relationship:
Operating
MRC:
An indication of the feature/s/ of the inclosure.ANPZ
Inclosure Feature:
Single item w/carrying case
MRC:
Indicates the type of test for which the item is designed.AQXY
Test Type For Which Designed:
Fault isolation of ic's
MRC:
The number of alternating current phases.FAAZ
Phase:
Single
MRC:
A measurement from the bottom to the top of an object,in distinction from depth.HGTH
Height:
5.500 inches

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