Teilenummer
Entmilitarisierung
Lagerfähigkeit
UOM
NIIN
Entmilitarisierung:
Yes - DEMIL/MLI
Informationen zum Teil
Microcircuit, memory, digital, cmos uv erasable pal
NSN
Nationale Bestandsnummer:
TXT
Beschreibung:
Memory Microcircuit
MRC:
The maximum amount of electrical energy that can be expended by an item.AEHX
Maximum Power Dissipation Rating:
1.2 watts
MRC:
The minimum and maximum limits of temperature at which the item is rated for operation.AFGA
Operating Tempurature Range:
-65.0/+150.0 degrees celsius
MRC:
The minimum and maximum temperatures at which an item can be stored without detrimental effect.AFJQ
Storage Tempurature Range:
-65.0/+150.0 degrees celsius
MRC:
Those features,not otherwise specified,which may be required for proper functioning of the item.CBBL
Features Provided:
Ultraviolet erasable and programmed and monolithic
MRC:
The chemical compound or mechanical mixture properties of which the inclosure is fabricated.CQSJ
Inclosure Material:
Ceramic
MRC:
Indicates the physical configuration of the inclosure.CQSZ
Inclosure Configuration:
Flat pack
MRC:
An indication of the basic electronic circuit elements assembled to output a logic function.CQWX
Output Logic Form:
Complementary-metal oxide-semiconductor logic
MRC:
The arrangement or pattern which describes the input circuitry of the item.CQZP
Input Circuit Pattern:
22 input
MRC:
The alpha-numeric designation,assigned by the controlling agency,by which the outline of the case is identified.CTFT
Case Outline Source And Designator:
F-16 mil-m-38510
MRC:
The level of electrical flow and the symbol used to identify the specific electrical characteristic.CTQX
Current Rating Per Characteristic:
16.00 milliamperes reverse current, dc
MRC:
The metallic,nonmetallic,and/or chemical properties with which the item is plated,dipped,and/or coated. the treatment is designed to protect the terminal surface(s) and cannot be wiped off.CWSG
Terminal Surface Treatment:
Solder
MRC:
The value of the voltage applied and type of specific electrical characteristic for which the item is designed.CZEN
Voltage Rating And Type Per Characteristic:
-0.5 volts applied and 7.0 volts applied
MRC:
The acceptable time limitation for the item per characteristic.CZEQ
Time Rating Per Chacteristic:
25.00 nanoseconds af output megawatts
MRC:
Indicates the type of memory device used on the item.CZER
Memory Device Type:
Pal
MRC:
Indicates the type of hybrid technology used in the item.CZES
Hybrid Technology Type:
Monolithic
MRC:
The specification,standard,drawing,or similar instrument that specifies environmental and performance requirements or test conditions under which an item is tested and establishes acceptable limits within which the item must conform identified by an alphabetic and/or numeric reference number. includes the commercial and government entity (cage) code of the entity controlling the instrument.TEST
Test Data Document:
81349-mil-m-38510 specification (includes engineering type bulletins, brochures, etc., that reflect specification type data in specification format; excludes commercial catalogs, industry directories, and similar trade publications, reflecting general type data on certain environmental and performance requirements and test conditions that are shown as "typical", "average", "", etc.). And 96906-mil-std-883 standard (includes industry or association standards, individual manufactureer standards, etc.). And 96906-mil-std-1835 standard (includes industry or association standards, individual manufactureer standards, etc.).
MRC:
Indicates the type and number of terminals for providing electrical connection.TTQY
Terminal Type And Quantity:
24 printed circuit
MRC:
The document designator of the specification or standard which established the item of supply.ZZZK
Specification Data:
67268-5962-8753901ka government standard and 94987-258480-6 manufacturers source control
MRC:
The variation when the item is in conformity with a type designator covered by a specification or standard,except in regard to one or more technical differentiating characteristics.ZZZX
Departure From Cited Designator:
Altered by programming & marking