Teilenummer TS1836CU

Semiconductor Device Test Set

Preise und Verfügbarkeit

Reichen Sie dieses Formular ein, um die aktuellen Preise und die Verfügbarkeit dieser NSN zu erfahren.
Teilenummer:
Menge:
E-Mail-Adresse:
Telefon:
Referenz:
Firma:
Name:

Wir geben Ihre Daten nicht an Dritte weiter und verkaufen sie auch nicht.
Privatsphäre | Bedingungen

All major credit cards accepted as well as gov. p-cards

Historische Preise für dieses Produkt liegen zwischen 193.68 and 261.468 USD. Abhängig von Menge, Verfügbarkeit, Zustand, Lieferzeit und möglicher Einstellung eines Artikels können wir die Preise erst garantieren, wenn wir Ihnen ein aktuelles Angebot unterbreiten.

Teilenummer
Entmilitarisierung
Lagerfähigkeit
UOM
NIIN
Teilenummer:
ts1836cu
Entmilitarisierung:
Yes - DEMIL/MLI
Lagerfähigkeit:
N/A
Maßeinheit:
1 EA
NIIN:
001592263
NSN
Nationale Bestandsnummer:
6625-00-159-2263 6625001592263
TXT
Beschreibung:
Semiconductor Device Test Set
INC
INC
Artikelname-Code:
25006
INC
COM
Beachtung:
MRC:
A measurement taken at right angles to the length of an item,in distinction from thickness.ABGL
Width:
7.000 inches
MRC:
A measurement of the longest dimension of any object,in distinction from width.ABRY
Length:
6.500 inches
MRC:
The value,or range of values,of direct current potential for which the item is rated.ACYR
Dc Voltage Rating:
9.0 volts
MRC:
The principal parts that are included in an assembled unit.AEAS
Major Components:
Test leads
MRC:
The number of parts supplied with the item which may be required for application.AFHS
Accessory Component Quantity:
3
MRC:
The name assigned to the item by the joint electronics type designation system.AKWA
Joint Electronics Type Designation System Item Name:
Test set, transistor
MRC:
The type number assigned to the item by the joint electronics type designation system.AKWB
Joint Electronics Type Designation System Item Type Number:
Ts-1836c/u
MRC:
The relationship of the electrical power source to the item.AKWC
Electrical Power Source Relationship:
Operating
MRC:
An indication of whether or not a facility/ies/ to accommodate a battery/ies/ is included.ALSF
Internal Battery Accommodation:
Included
MRC:
The element,compound,or mixture of which the item is fabricated,excluding any surface treatment,and its location.ANNQ
Material And Location:
Plastic carrying case
MRC:
An indication of the feature/s/ of the inclosure.ANPZ
Inclosure Feature:
Single item w/carrying case
MRC:
Indicates the type of test for which the item is designed.AQXY
Test Type For Which Designed:
Transistor beta; electrode resistance and current; field effect transistor, diode and rectifier
MRC:
The testing functions such as range,sensitivity,output,and the like,for which the item is designed.AQXZ
Operating Test Capability:
Beta test range 1 to 100 porm 5 pct out of circuit, 10 to 1000 porm 5 pct in circuit, 1 to 100 porm 10 pct 500 ohm load emitter to base, 10 to 1000 porm 10 pct 500 ohm load emitter to base; electrode resistance range 0 to 5000 porm 5 pct emitter to base, 0 to 5000 porm 5 pct collector to base, 0 to 5000 porm 5 pct collector to emmitter; electrode current range 0 to 100 ua porm 3 pct full scale collector cut off emitter open, 0 to 1 ma porm 3 pct full scale; collector cut off emitter open; fieldeffect transistor gain maximum or min range 0 to 2500 micromhosporm 5 pct out ofcircuit, 0 to 2500 micromhos porm 10 pct in circuit; gate source load 100 ohms; drain source load 4000 ohm; diode current range 0 to 100 ua porm 3 pct full scale, 0 to 1 ma porm 3 pct full scale; diode reverse to forward ratio 1, 10 porm 5 pct
MRC:
A measurement from the bottom to the top of an object,in distinction from depth.HGTH
Height:
8.500 inches

Ähnlich Semiconductor Device Test Sets

« Electrical and Electronic Properties Measuring and Testing Instruments {lang[catalog]}
Jetzt vergleichen»
Klar | Verstecken